Lto stuck tape test, Lto encryption test, Read/write test – HP StoreEver TapeAssure Software User Manual

Page 43

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LTO Stuck Tape test

Description

This test tries to determine if the cartridge in the drive is physically stuck, or
if it can be unloaded and recovered.

When to run

Run this test only if you suspect that the cartridge is stuck.

Available for

Standalone LTO drives only

LTO Encryption test

Description

This test checks that the encryption capabilities of the LTO4 or later
generation drive is working correctly. Data is written and read using
different combinations of encryption mode, decryption mode, and using
both invalid and valid keys, checking for the correct response from the
drive in each case. The tape is checked at the beginning of the test to
insure that it will correctly support encryption and may therefore be used
as a test tape.

When to run

Run this test if you want to insure that encryption is working correctly for
the LTO4 or later generation drive.

Average duration

2–3 minutes

Other notes

This test will overwrite all data on the media.

Available for

LTO4 and later generation tape drives, both standalone and within
libraries.

Read/Write test

CAUTION:

This test is destructive and will overwrite data on the media that is present in your

product.

NOTE:

The Read/Write test is superseded by the

“Assessment test” (page 27)

, which asses drive

health, and the

“Drive Performance test” (page 45)

, which measures performance and pushes the

drive to maximum performance. HP recommends using these tests instead of the Read/Write test
because they are effective diagnostics.

Description

This test performs a self-test on the drive device, then a write-read media
test to verify the ability to read and write data to and from the removable
media in your storage device. This test also checks error rates and fails
if allowable limits are exceeded. Test options allow the user to select
the amount of data or length of test time, the amount of data transferred
per command, and the data pattern.

The Write/Read test includes the same parameters as the existing Device
Performance test but it should not be used for performance measurements
as it does not use the tape driver and runs more slowly. Please use the
Device Performance test for accurate performance measurements.

Diagnostic tests

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