Capacitance (for all packages) [10, Thermal resistance [10, Ac test loads and waveforms – Cypress CY62148EV30 User Manual

Page 4: Data retention waveform, Mobl, Capacitance, Thermal resistance, Data retention characteristics

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MoBL

®

CY62148EV30

Document #: 38-05576 Rev. *G

Page 4 of 12

Capacitance

(For All packages)

[10]

Parameter

Description

Test Conditions

Max

Unit

C

IN

Input Capacitance

T

A

= 25°C, f = 1 MHz,

V

CC

= V

CC(typ)

10

pF

C

OUT

Output Capacitance

10

pF

Thermal Resistance

[10]

Parameter

Description

Test Conditions

VFBGA

Package

TSOP II

Package

SOIC

Package

Unit

Θ

JA

Thermal Resistance

(Junction to Ambient)

Still Air, soldered on a 3 x 4.5 inch,

two-layer printed circuit board

72

75.13

55

°C/W

Θ

JC

Thermal Resistance

(Junction to Case)

8.86

8.95

22

°C/W

AC Test Loads and Waveforms

Parameters

2.50V

3.0V

Unit

R1

16667

1103

Ω

R2

15385

1554

Ω

R

TH

8000

645

Ω

V

TH

1.20

1.75

V

Data Retention Characteristics

(Over the Operating Range)

Parameter

Description

Conditions

Min

Typ

[4]

Max

Unit

V

DR

V

CC

for Data Retention

1.5

V

I

CCDR

[9]

Data Retention Current

V

CC

= 1.5V, CE > V

CC

– 0.2V,

V

IN

> V

CC

– 0.2V or V

IN

<

0.2V

Ind’l/Auto-A

0.8

7

μA

t

CDR

[10]

Chip Deselect to Data Retention Time

0

ns

t

R

[11]

Operation Recovery Time

t

RC

ns

Data Retention Waveform

V

CC

V

CC

OUTPUT

R2

30 pF

INCLUDING

JIG AND

SCOPE

GND

90%

10%

90%

10%

Rise Time = 1 V/ns

Fall Time = 1 V/ns

OUTPUT

V

Equivalent to:

THEVENIN

EQUIVALENT

ALL INPUT PULSES

R

TH

R1

V

CC(min)

V

CC(min)

t

CDR

V

DR

> 1.5V

DATA RETENTION MODE

t

R

V

CC

CE

Notes

10. Tested initially and after any design or process changes that may affect these parameters.
11. Full device AC operation requires linear V

CC

ramp from V

DR

to V

CC(min)

> 100

μs or stable at V

CC(min)

> 100

μs.

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