Philips SA5211 - Manual (Page 3)

Philips Semiconductors
SA5211
Transimpedance amplifier (180 MHz)
Product specification Rev. 03 — 07 October 1998 3 of 28
9397 750 07427 © Philips Electronics N.V. 2001. All rights reserved.
7. Static characteristics
[1] Test condition: output quiescent voltage variation is less than 100 mV for 3 mA load current.
8. Dynamic characteristics
Table 3: Recommended operating conditions
Symbol Parameter Conditions Min Max Unit
V
CC
supply voltage 4.5 5.5 V
T
amb
ambient temperature range -40 +85
°
C
T
J
junction temperature range -40 +105
°
C
Table 4: DC electrical characteristics
Min and Max limits apply over operating temperature range at V
CC
= 5 V, unless otherwise specified. Typical data apply at
V
CC
= 5 V and T
amb
= 25
°
C.
Symbol Parameter Test conditions Min Typ Max Unit
V
IN
input bias voltage 0.55 0.8 1.00 V
V
O ± output bias voltage 2.7 3.4 3.7 V
V
OS
output offset voltage
−
0 130 mV
I
CC
supply current 20 26 31 mA
I
OMAX
output sink/source current [1] 3 4
−
mA
I
IN
input current
(2% linearity) Test Circuit 8,
Procedure 2
±
20
±
40
− µ
A
I
IN MAX
maximum input current
overload threshold Test Circuit 8,
Procedure 4
±
30
±
60
− µ
A
Table 5: AC electrical characteristics
Typical data and Min and Max limits apply at V
CC
= 5 V and T
amb
= 25
°
C
Symbol Parameter Test conditions Min Typ Max Unit
R
T
transresistance (differential output) DC tested RL =
∞
Test Circuit 8, Procedure 1
21 28 36 k
Ω
R
O
output resistance (differential output) DC tested
−
30
− Ω
R
T
transresistance (single-ended output) DC tested
RL =
∞
10.5 14 18.0 k
Ω
R
O
output resistance (single-ended output) DC tested
−
15
− Ω
f
3dB
bandwidth (-3dB) T
A
= 25
°
C
Test circuit 1
−
180
−
MHz
R
IN
input resistance
−
200
− Ω
C
IN
input capacitance
−
4
−
pF
∆
R/
∆
V transresistance power supply sensitivity V
CC
= 5
±
0.5 V
−
3.7
−
%/V
∆
R/
∆
T transresistance ambient temperature sensitivity
∆
T
amb
= T
amb MAX
-T
amb MIN
−
0.025
−
%/
°
C
I
N
RMS noise current spectral density (referred to
input) Test Circuit 2
f = 10 MHz
TA = 25
°
C
−
1.8
−
pA/
√
Hz
I
T
integrated RMS noise current over the
bandwidth (referred to input) TA = 25
°
C
Test Circuit 2
− − − −