Philips SA5211 - Manual (Page 9)

Philips Semiconductors
SA5211
Transimpedance amplifier (180 MHz)
Product specification Rev. 03 — 07 October 1998 9 of 28
9397 750 07427 © Philips Electronics N.V. 2001. All rights reserved.
Fig 6. Test circuit 8.
GND 2
Test Circuit 8
OUT +
OUT –
GND 1
IN DUT
I IN ( µ A)
5V
V OUT (V)
+
–
Typical Differential Output Voltage
vs Current Input
2.00
1.60
1.20
0.80
0.40
0.00
–0.40
–0.80
–1.20
–1.60
–2.00
–100 –80 –60 –40 –20 0 20 40 60 80 100
DIFFERENTIAL OUTPUT
V
O
L
T
A
GE (V)
CURRENT INPUT ( µ A)
NE5211 TEST CONDITIONS
Procedure 1 R T measured at 15 µ A
R T = (V O1 – V O2 )/(+15 µ A – (–15 µ A))
Where: V O1 Measured at I IN = +15 µ A
V O2 Measured at I IN = –15 µ A
Procedure 2 Linearity = 1 – ABS((V OA – V OB ) / (V O3 – V O4 ))
Where: V O3 Measured at I IN = +30 µ A
V O4 Measured at I IN = –30 µ A
Procedure 3 V OMAX = V O7 – V O8
Where: V O7 Measured at I IN = +65 µ A
V O8 Measured at I IN = –65 µ A
Procedure 4 I
IN
Test Pass Conditions:
V
O7
– V
O5
> 20mV and V
06
– V
O5
> 50mV
Where: V O5 Measured at I IN = +40 µ A
V O6 Measured at I IN = –400 µ A
V O7 Measured at I IN = +65 µ A
V O8 Measured at I IN = –65 µ A
SD00331
V OB = R T
× (– 30 µ A) + V OB
V OA = R T
× (+ 30 µ A) + V OB