Dmn2004wk maximum ratings, Thermal characteristics, Electrical characteristics – Diodes DMN2004WK User Manual

Page 2

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DMN2004WK

Document number: DS30934 Rev. 5 - 2

2 of 6

www.diodes.com

September 2013

© Diodes Incorporated

DMN2004WK

Maximum Ratings

(@T

A

= +25°C, unless otherwise specified.)

Characteristic

Symbol

Value

Units

Drain-Source Voltage

V

DSS

20

V

Gate-Source Voltage

V

GSS

±8 V

Drain Current (Note 5)

Steady

State

T

A

= +25°C

T

A

= +85°C

I

D

540
390

mA

Pulsed Drain Current (Note 6)

I

DM

1.5 A



Thermal Characteristics

(@T

A

= +25°C, unless otherwise specified.)

Characteristic

Symbol

Value

Units

Total Power Dissipation (Note 5)

P

D

200

mW

Thermal Resistance, Junction to Ambient

R

JA

625

°C/W

Operating and Storage Temperature Range

T

J,

T

STG

-55 to +150

°C

Notes:

5. Device mounted on FR-4 PCB.

6. Pulse width

10S, Duty Cycle 1%.



Electrical Characteristics

(@T

A

= +25°C, unless otherwise specified.)

Characteristic

Symbol

Min

Typ

Max

Unit

Test Condition

OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage

BV

DSS

20

V

V

GS

= 0V, I

D

= 10

A

Zero Gate Voltage Drain Current

I

DSS

1

μA

V

DS

= 16V, V

GS

= 0V

Gate-Source Leakage

I

GSS

1

μA

V

GS

=

4.5V, V

DS

= 0V

ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage

V

GS(th)

0.5

1.0

V

V

DS

= V

GS

, I

D

= 250

A

Static Drain-Source On-Resistance

R

DS (ON)

0.4
0.5

0.7

0.55
0.70

0.9

V

GS

= 4.5V, I

D

= 540mA

V

GS

= 2.5V, I

D

= 500mA

V

GS

= 1.8V, I

D

= 350mA

Forward Transfer Admittance

|Y

fs

|

200

ms

V

DS

=10V, I

D

= 0.2A

Diode Forward Voltage (Note 7)

V

SD

0.5

1.4 V

V

GS

= 0V, I

S

= 115mA

DYNAMIC CHARACTERISTICS(Note 8)
Input Capacitance

C

iss

150

pF

V

DS

= 16V, V

GS

= 0V

f = 1.0MHz

Output Capacitance

C

oss

25

pF

Reverse Transfer Capacitance

C

rss

20

pF

Notes:

7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.






















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