B&K Precision 575A - Manual - Manual (Page 12)

Model 575A Digital IC Tester
Copyright
 1992-2007 B&K Precision Corp.
Page 8
10. continuous testing
It is possible to test the same IC repeatedly to detect intermittent or
temperature-related faults, or to rapidly test a batch of identical ICs.
There are three types of test loop modes:
Loop - execute a test repeatedly, regardless of the result.
P Loop - execute a test repeatedly, provided the result is PASS.
F Loop - execute a test repeatedly, provided the result was
FAIL.
The B & K Model 575A is configured into one of the loop modes
using the MODE/CLEAR key as described earlier. Insert the IC and
press TEST/EXEC in the usual way to start the continuous test
process. The result of each test is displayed as PASS or FAIL on the
top right of the display. In LOOP mode, this allows a large batch of
identical ICs to be tested, without any action on the part of the
operator other than inserting the IC.
When the IC is inserted,
sufficient time must be allowed for the test to take place before the
result status is updated, so if in doubt the IC should be tested in
single mode so that the approximate test time can be determined.
It will be found that high throughput can be obtained using this
mode.
To stop any of the test loops, press MODE/CLEAR, but note that the
test in progress is completed before the command is obeyed. The
effect of this is usually unnoticeable, but where the test takes a
reasonable time to execute there will be a delay before the
instrument responds to the MODE/CLEAR key.
Note: Testing high current ICs in loop mode w ill drain the
batteries quickly, and it is recommended that a battery eliminator
is used if you w ish to perform loop tests.
11. search mode
This feature allows the type number of an unknown IC to be
determined, provided the IC is actually contained in the B & K