B&K Precision 575A - Manual - Manual (Page 23)

Model 575A Digital IC Tester
Copyright
 1992-2007 B&K Precision Corp.
Page 19
Note 6: The ROM/EPROM tests perform a blank check and
checksum on the IC, and display the contents of the first 16
locations.
These tests cannot confirm the integrity of an IC, or
identify it in SEARCH mode, since they have no knowledge of the
intended contents of the EPROM. Please be patient when testing
EPROMs in this way - some of the larger ICs take a long time to
read.
15.9. notes on interface ICs
Note 7: The MOS version of this IC is internally dynamic, and the
test may FAIL after a prolonged in-circuit LOOP test. The CMOS
version, however, is completely static.
Note 8: The 8742 EPROM version of this IC must have the erase
window covered otherwise the test may FAIL.
Note 9: The 8039 and 8040 ICs should be tested in FAIL LOOP
mode due to the power down mode of the ICs affecting tester
synchronization.
Note 10: This IC should only be tested in SINGLE MODE with a 1uF
decoupling CAPACITOR connected across the supply and ground
pins 29 and 20 of the ZIF socket (IC pins 18 and 9) due to its high
supply current requirement.
Note 11: This IC requires a 1uF decoupling CAPACITOR to be
connected across the supply and ground pins 10 and 31 of the ZIF
socket due to its high supply current requirement.
Note 12: This IC may need to be tested in FAIL LOOP MODE.