Temperature test profile, Tested at 60°c (140°f), Removed from oven and tested at 60°c (140°f) – Rockwell Automation 56RF High Temperature ICODE Tag (High Frequency RFID 13.56 MHz) User Manual

Page 2: Time at elevated temperature

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56RF-IN011B-EN-P

September 2014

Copyright © 2014 Rockwell Automation, Inc. All Rights Reserved.

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Temperature test profile

The 56RF-TG-50HT high temperature tags were tested according
to the following profile:

1. Tested at 60°C (140°F)

2. Placed in an oven at 185°C (365°F) for 30 minutes and then

240°C (464°F) for 30 minutes

3. Removed from oven and tested at 60°C (140°F)

The cycle was repeated after 20 minutes.

Time at elevated temperature

The length of time the tags can withstand elevated temperature
depends on the temperature (see table and graph below).

Temperature

x

[C (F)]

Time

y

minutes

200° (392°)

60

220° (428°)

45

240° (464°)

30

x

60°

(140°)

185°

(365°)

Time (minutes)

3

3

4

20

30

y

Temperature

[°C (°F)]

Non-operating

Operating
(Read/write)

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