Thermal resistance, Ac test loads and waveforms, Data retention characteristics – Cypress CY62148E User Manual

Page 4: Data retention waveform

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CY62148E MoBL

®

Document #: 38-05442 Rev. *F

Page 4 of 10

Thermal Resistance

[10]

Parameter

Description

Test Conditions

SOIC

Package

TSOP II

Package

Unit

Θ

JA

Thermal Resistance

(Junction to Ambient)

Still Air, soldered on a 3 × 4.5 inch,

two-layer printed circuit board

75

77

°C/W

Θ

JC

Thermal Resistance

(Junction to Case)

10

13

°C/W

AC Test Loads and Waveforms

Parameters

5.0V

Unit

R1

1800

R2

990

R

TH

639

V

TH

1.77

V

Data Retention Characteristics

(Over the Operating Range)

Parameter

Description

Conditions

Min

Typ

[3]

Max Unit

V

DR

V

CC

for Data Retention

2

V

I

CCDR

Data Retention Current

V

CC

= V

DR

, CE > V

CC

– 0.2V,

V

IN

> V

CC

– 0.2V or V

IN

< 0.2V

Ind’l/Auto-A

1

7

µA

t

CDR

[10]

Chip Deselect to Data Retention Time

0

ns

t

R

[11]

Operation Recovery Time

t

RC

ns

Data Retention Waveform

3.0V

V

CC

OUTPUT

R2

30 pF

INCLUDING

JIG AND

SCOPE

GND

90%

10%

90%

10%

Rise Time = 1 V/ns

Fall Time = 1 V/ns

OUTPUT

V

Equivalent to:

THEVENIN

EQUIVALENT

ALL INPUT PULSES

R

TH

R1

V

CC(min)

V

CC(min)

t

CDR

V

DR

> 2.0V

DATA RETENTION MODE

t

R

V

CC

CE

Note

11. Full device operation requires linear V

CC

ramp from V

DR

to V

CC(min)

> 100

µs or stable at V

CC(min)

> 100

µs.

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