Thermal resistance, Ac test loads and waveforms, Data retention characteristics – Cypress CY62167DV18 User Manual

Page 4: Data retention waveform

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CY62167DV18 MoBL

®

Document #: 38-05326 Rev. *C

Page 4 of 11

Thermal Resistance

[7]

Parameter

Description

Test Conditions

VFBGA

Unit

Θ

JA

Thermal Resistance

(Junction to Ambient)

Still Air, soldered on a 3 × 4.5 inch,

two-layer printed circuit board

55

°C/W

Θ

JC

Thermal Resistance

(Junction to Case)

16

°C/W

AC Test Loads and Waveforms

V

CC

V

CC

OUTPUT

R2

30 pF

INCLUDING

JIG AND

SCOPE

GND

90%

10%

90%

10%

Rise Time = 1 V/ns

Fall Time = 1 V/ns

OUTPUT

V

Equivalent to:

THE VENIN EQUIVALENT

ALL INPUT PULSES

R

TH

R1

Parameters

1.8V

Unit

R1

13500

R2

10800

R

TH

6000

V

TH

0.80

V

Data Retention Characteristics

(Over the Operating Range)

Parameter

Description

Conditions

Min

Typ

[2]

Max

Unit

V

DR

V

CC

for Data Retention

1.0

1.95

V

I

CCDR

Data Retention Current

V

CC

= 1.0V, CE

1

> V

CC

– 0.2V, CE

2

< 0.2V,

V

IN

> V

CC

– 0.2V or V

IN

< 0.2V

10

µA

t

CDR

[7]

Chip Deselect to Data Retention Time

0

ns

t

R

[8]

Operation Recovery Time

t

RC

ns

Data Retention Waveform

[9]

V

CC

, min

V

CC

, min

t

CDR

V

DR

> 1.0V

t

R

CE

1

or

V

CC

BHE

,

BLE

or

CE

2

DATA RETENTION MODE

Notes

8. Full device operation requires linear V

CC

ramp from V

DR

to V

CC(min)

> 100

µs or stable at V

CC(min)

> 100

µs.

9. BHE.BLE is the AND of both BHE and BLE. Deselect the chip by either disabling the chip enable signals or by disabling both BHE and BLE.

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