Reliability, 1 component derating, 2 mean time between failures (mtbf) – Intel ATX 0.9 User Manual

Page 29

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Intel ATX Power Supply Design Guide

Version 0.9

Page

29

7. Reliability

7.1 Component Derating

The following component derating guidelines shall be followed:

Semiconductor junction temperatures shall not exceed 110 °C with an ambient of
50 °C. Any exceptions are subject to final approval.

Inductor case temperature shall not exceed safety agency requirements.

Capacitor case temperature shall not exceed 95% of rated temperature.

Resistor wattage derating shall be > 30%.

Component voltage and current derating shall be > 10% at 50 °C. Any exceptions are
subject to final approval.

Magnetic saturation of any transformer will not be allowed under any line, load, startup,
or transient condition including 100% transients on the five main outputs or +5VSB.

7.2 Mean Time Between Failures (MTBF)

The MTBF of the power supply shall be calculated utilizing the Part-Stress Analysis
method of MIL-HDBK-217F using the quality factors listed in MIL-HDBK-217F. The
calculated MTBF of the power supply shall be greater than 100,000 hours under the
following conditions:

Full rated load

120 VAC input

Ground benign

25 °C ambient.

The calculated MTBF of the power supply shall be greater than 30,000 hours under the
following conditions:

Full rated load

120 VAC input

Ground benign

50 °C ambient.

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