Device analysis test – HP Library and Tape Tools User Manual

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Table 1 Drive Assessment test details (continued)

Drive Assessment test

Details/Device specific test

Run error rate tests—The test runs a series of internal error rate tests at different
speeds and different tape directions. This the core of the assessment test.

Clean up—The error rate tests leave the cartridge in an 'invalid' state, which is
reset with a short erase process.

Requires that a cartridge be already loaded or in the process of loading when the test
is started.

Test performed

Looks at drive history (runs device analysis and looks at LTO reports information).

Checks the test cartridge history to insure it is suitable for running the test.

Checks whether the drive is requesting cleaning.

Performs an unload/load cycle, checking for any mechanical issues.

Writes two wraps of data using varying tape speeds in both directions measuring
write and read-while-write margin.

When to run

Run this test if you suspect a drive has failed.

You should run the Media Test option if directed to do so by an HP tool or support.

Duration

Test times vary greatly depending on drive type, media quality, and options selected.
Average time for a healthy drive with good tape can range from 10 to 20 minutes.

A marginal drive (or drive with marginal tape) may take substantially longer.

For the LTO test, the following options are available:

Options

Allow Overwrite (defaults to FALSE)—set to TRUE to avoid the interactive warning
about erasing data on the test tape.

Test Coverage (defaults to DEFAULT, which is two wraps)—A wrap is one full length
of the tape in one direction. ‘2X' test coverage is twice the default (4 wraps) and
‘4X' test coverage is four times the default (8 wraps). Typical test times for
'Default'/2X/4X test coverage options are 15/30/60 minutes.

Results

If the test reports that the drive is good, the user can be confident that the drive is
working as advertised and is not the cause of any backup or restore issues in the
drive. A device that is determined to be FFP performs according to its specification.

If the test fails, HP support will accept that assessment without further diagnostics,
making this a key test for both end users and HP support. If a device fails the
Assessment test, it should be replaced. If it passes, the problem is likely not with
the health of that device.

Available for

DLT 4000/7000/8000

DLT1/VS80/VS160

SDLT 220/320/600

LTO-1 (Ultrium 215 and 230), LTO-2 (Ultrium 448 and 460) drives, and LTO-3
drives (Ultrium 920 and 960)

LTO-4(Ultrium 1760 and 1840), LTO-5 (Ultrium 3000 and 3280), LTO-6(Ultrium
6000 and Ultrium 6250)

DDS3, DDS4, DAT72, DAT160, and DAT320 (pre and post-merger HP drives
only)—Newer test

Device Analysis test

Table 2 Device Analysis test details

Device Analysis test

Details/Device specific test

The Device Analysis test runs a device-specific script that carries out a detailed
examination of the device. The test examines all available logs from the device to look

Description

Diagnostic tests

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