Scsi signals—sd[15:0]/, sdp[1:0]/, sreq/, sack, Scsi signals—smsg, si_o/, sc_d/, satn/, sbsy, Burst read – Avago Technologies LSI53C876E User Manual
Page 235: Burst write
DC Characteristics
6-3
Table 6.3
SCSI Signals—SD[15:0]/, SDP[1:0]/, SREQ/, SACK/
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
1.9
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
1.0
V
–
V
OH
1
1. TolerANT active negation enabled.
Output high voltage
2.5
3.5
V
2.5 mA
V
OL
Output low voltage
V
SS
0.5
V
48 mA
I
OZ
3-state leakage
−
10
10
µ
A
–
Table 6.4
SCSI Signals—SMSG, SI_O/, SC_D/, SATN/, SBSY/, SSEL/, SRST/
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
1.9
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
1.0
V
–
V
OL
Output low voltage
V
SS
0.5
V
48 mA
I
OZ
3-state leakage
(SRST/ only)
−
10
−
500
10
−
50
µ
A
–
Table 6.5
Input Signals—CLK, SCLK, GNT/, IDSEL, RST/, TESTIN, DIFFSENS
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
2.0
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
0.8
V
–
I
IN
Input leakage
−
10
10
µ
A
–
Note: SCLK and RST/ have 100
µ
A pull-ups that are enabled when TESTIN is low. GNT/ and IDSEL
have 25
µ
A pull-ups that are enabled when TESTIN is low. TESTIN has a 100
µ
A pull-up that
is always enabled.