6 reliability, 7 testability, Reliability – LSI 53C875A User Manual

Page 22: Testability

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1-8

General Description

•

SCSI clock quadrupler bits enable Ultra SCSI transfer rates with a 20
or 40 MHz SCSI clock input.

•

Selectable IRQ pin disable bit.

•

Ability to route system clock to SCSI clock.

•

Compatible with 3.3 V and 5 V PCI.

1.4.6 Reliability

Enhanced reliability features of the LSI53C875A include:

•

2 kV ESD protection on SCSI signals.

•

Protection against bus reflections due to impedance mismatches.

•

Controlled bus assertion times (reduces RFI, improves reliability, and
eases FCC certification).

•

Latch-up protection greater than 150 mA.

•

Voltage feed-through protection (minimum leakage current through
SCSI pads).

•

High proportion (> 25%) of device pins are power or ground.

•

Power and ground isolation of I/O pads and internal chip logic.

•

TolerANT technology, which provides:

–

Active negation of SCSI Data, Parity, Request, and Acknowledge
signals for improved fast SCSI transfer rates.

–

Input signal filtering on SCSI receivers improves data integrity,
even in noisy cabling environments.

1.4.7 Testability

The LSI53C875A provides improved testability through:

•

Access to all SCSI signals through programmed I/O.

•

SCSI loopback diagnostics.

•

SCSI bus signal continuity checking.

•

Support for single step mode operation.

•

JTAG boundary scan.

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