Rainbow Electronics AT45DB161D User Manual
Page 31
31
3500O–DFLASH–11/2012
AT45DB161D
Table 18-4.
AC Characteristics – RapidS/Serial Interface
Note:
1. Values are based on device characterization, not 100% tested in production
Symbol
Parameter
AT45DB161D
(2.5V Version)
AT45DB161D
Min
Typ
Max
Min
Typ
Max
Units
f
SCK
SCK Frequency
50
66
MHz
f
CAR1
SCK Frequency for Continuous Array Read
50
66
MHz
f
CAR2
SCK Frequency for Continuous Array Read
(Low Frequency)
33
33
MHz
t
WH
SCK High Time
6.8
6.8
ns
t
WL
SCK Low Time
6.8
6.8
ns
t
SCKR
(1)
SCK Rise Time, Peak-to-Peak (Slew Rate)
0.1
0.1
V/ns
t
SCKF
(1)
SCK Fall Time, Peak-to-Peak (Slew Rate)
0.1
0.1
V/ns
t
CS
Minimum CS High Time
50
50
ns
t
CSS
CS Setup Time
5
5
ns
t
CSH
CS Hold Time
5
5
ns
t
CSB
CS High to RDY/BUSY Low
100
100
ns
t
SU
Data In Setup Time
2
2
ns
t
H
Data In Hold Time
3
3
ns
t
HO
Output Hold Time
0
0
ns
t
DIS
Output Disable Time
27
35
27
35
ns
t
V
Output Valid
8
6
ns
t
WPE
WP Low to Protection Enabled
1
1
µs
t
WPD
WP High to Protection Disabled
1
1
µs
t
EDPD
CS High to Deep Power-down Mode
3
3
µs
t
RDPD
CS High to Standby Mode
35
35
µs
t
XFR
Page to Buffer Transfer Time
200
200
µs
t
COMP
Page to Buffer Compare Time
200
200
µs
t
EP
Page Erase and Programming Time
(512-/528-bytes)
17
40
17
40
ms
t
P
Page Programming Time (512-/528-bytes)
3
6
3
6
ms
t
PE
Page Erase Time (512-/528-bytes)
15
35
15
35
ms
t
BE
Block Erase Time (4096-/4224-bytes)
45
100
45
100
ms
t
SE
Sector Erase Time (131,072/135,168-bytes)
0.7
1.3
0.7
1.3
s
t
CE
Chip Erase Time
12
25
12
25
s
t
RST
RESET Pulse Width
10
10
µs
t
REC
RESET Recovery Time
1
1
µs