Bibliography, Atmega162/v – Rainbow Electronics ATmega162V User Manual
Page 202
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202
ATmega162/V
2513E–AVR–09/03
Bibliography
For more information about general Boundary-scan, the following literature can be
consulted:
•
IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993
•
Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-
Wesley, 1992
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