Diodes DMN3200U User Manual

Dmn3200u new prod uc t, Features, Mechanical data

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DMN3200U

Document number: DS31188 Rev. 5 - 2

1 of 5

www.diodes.com

October 2013

© Diodes Incorporated

DMN3200U

NEW PROD

UC

T

N-CHANNEL ENHANCEMENT MODE FIELD EFFECT TRANSISTOR

Features

 Low

On-Resistance

 90

m

 @ V

GS

= 4.5V

 110

m

 @ V

GS

= 2.5V

 200

m

 @ V

GS

= 1.5V

Very Low Gate Threshold Voltage

Low Input Capacitance

 ESD

Protected

Gate

Fast Switching Speed

Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)

Halogen and Antimony Free. “Green” Device (Note 3)

Qualified to AEC-Q101 Standards for High Reliability

Mechanical Data

 Case:

SOT-23

Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0

Moisture Sensitivity: Level 1 per J-STD-020

Terminal Connections: See Diagram

 Terminals:

Finish

 Matte Tin annealed over Copper

leadframe. Solderable per MIL-STD-202, Method 208

Weight: 0.008 grams (approximate)












Ordering Information

(Note 4)

Part Number

Case

Packaging

DMN3200U-7

SOT-23

3000/Tape & Reel

Notes:

1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.

2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green"

and Lead-free.

3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and

<1000ppm antimony compounds.

4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.




Marking Information

















Date Code Key

Year

2007

2008

2009

2010

2011

2012

2013

2014

2015 2016 2017

Code U V W X Y Z A B C D E

Month

Jan

Feb

Mar

Apr

May

Jun

Jul

Aug

Sep

Oct

Nov

Dec

Code 1 2 3 4 5 6 7 8 9 O N D






SOT-23

TOP VIEW

Equivalent Circuit

TOP VIEW

Source

Gate

Protection

Diode

Gate

Drain

ESD PROTECTED TO 3kV

D

G

S

32N = Marking Code
YM = Date Code Marking for SAT (Shanghai Assembly/ Test site)
= Date Code Marking for CAT (Chengdu Assembly/ Test site)
Y or = Year (ex: A = 2013)
M = Month (ex: 9 = September)

32N

YM

Chengdu A/T Site

Shanghai A/T Site

e3

Y

YM

32N

YM

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