Atec Agilent-E4916A - Manual (Page 2)

2
Mobile radios and communicators
are increasingly expanding their
applications into homes and offices.
This makes the evaluation of crystal
resonator characteristics at higher
frequencies and/or lower drive levels
more critical. However, conventional
crystal impedance meters based on
the oscillation method cannot
properly meet the current measure-
ment needs due to the following
limitations on:
• High-end measurement frequency
(60 MHz or below)
• Applicable power level
The HP E4916A is a crystal imped-
ance meter based on the transmission
π network method which enables you
to:
• Test at high frequencies (1 MHz to
180 MHz)
• Apply low drive level (0.1 nW to
1 mW, when testing a 25 Ω DUT
with the π circuit).
The HP E4916A yet provides a cost
effective solution, comparable
enough to conventional CI meters.
In addition to Fr and CI measure-
ments, the HP E4916A offers a variety
of testing capabilities including the
equivalent circuit analysis and the
drive level dependency characteristic
evaluation (DLD) through easy-to-
follow steps. It comes with the HP-IB
and parallel I/O interfaces for easy
connection to external equipment,
thus allowing an automatic testing
system to be configured.
Front View
Rear View
Key Features
• Based on the transmission π
network method recommended by
the IEC444 standard.
• Wide frequency range (1 MHz to
180 MHz)
• Easy to change the drive level
(0.1 nW to 1 mW)
• Applies up to 20 mW to the DUT
when used in combination with the
optional impedance probe (option
001)
• Allows you to use the same test
fixtures as those for the network
analyzer.
• Provides the π calibration to correct
errors resulting from the extension
of the cable.
• Saves and recalls up to 10 patterns
of the system settings together with
calibration data.
Displays Fr, CI, and Equivalent
Circuit Parameters (Backlit LCD)
Parallel I/O Port
Drive Level Selectable between 0.1 nW and 1 mW
(No Adjustments Required)
Evaporation Monitoring Function
Drive Level Dependency
Characteristic Evaluation Function Allows Testing at
up to 180 MHzv
Easy Pass/Fail Judgment
(No External PC Required)
RF Output Reference Input Test Signal Input Analog Voltage Output
HP-IB Interface External Trigger Input External Reference Signal Input