Verilink 1558D (34-00255) Product Manual - Manual (Page 31)

LAPS Operation 4-5 1558D APS CSU/DSU
ble from the three types of circuit screens discussed in this
section.
Performance Screen
The Performance screen (Figure 4-5) is only accessible
from the Circuits in Alarm, Circuits in Test, and Circuit List
screens. The Performance screen allows the user to view
detailed performance data for a particular circuit.
In addition to the normal fields in the top section of the
screen, the Performance Screen shows the circuit’s two ID
headers along with the circuit’s position designator. All of
these are found in the upper left corner of the display.
Pressing the <esc> key will take the user back to
the previous circuit list screen.
The Performance screen contains four fields which can be
altered by the user. The function of these three fields is dis-
cussed in the following paragraphs:
Target: Signifies which section of the selected circuit is
presently displayed. Pressing <space bar> will change this
field to the next selection. The choices are: ‘Side A, Near’,
‘Side B, Near’, ‘Side A, Far’, and ‘Side B, Far’. Far Targets
can only be accessed if the far unit is a slave 1558D.
‘Near’ refers to the data received by the 1558D that the user
is physically attached. ‘Far’ refers to the data received at the
1558D unit at the remote or far end. Detailed information is
displayed for each selection as described in the following
paragraphs.
Reset ESF Events: This field is both a display field and a
user command field. It shows the running total of ESF error
events for the circuit section selected in the ‘Target’ field.
This count accumulates until it reaches 65535 or is reset by
the user. The count can be reset by moving the highlighted
cursor to this field and pressing <enter>.
Reset Event Regs: This is a command field. Moving the
cursor to this field and pressing <enter> will cause all inter-
val data for the selected circuit section to be cleared.
SWO History: This command field is used to access the 30
day Switch Occurrence History screen. To access this infor-
mation, move the cursor highlight to the SWO History field
and press <enter>. The system responds by displaying the
Occurrence History display (see Figure 4-6). This display
lists the last thirty day completed periods (24 hours) and the
number of switch occurrences for each of those days. The
remainder of the fields in the Performance Screen are for
display only. They are defined as follows:
Status: The status of the currently selected circuit section.
This status is the same as that detailed for “Near/Far” on the
previous page.
24 Hr.% Error Free: This is the percentage of intervals
that were error free in the last 24 hours or since the event
registers were last cleared.
Completed Intervals: The number of 15-minute intervals
for which performance data has been collected. The maxi-
mum number is 96 (there are 96 fifteen minute intervals in a
24 hour period).
Event Free Intervals: The number of intervals that perfor-
mance data has been collected without ESF error events.
(Interval Data): Per AT&T technical references 54016
and 54017, the interval data consists of Errored Seconds
(ES), Consecutive Severely Errored Seconds (CSES), Loss
of Frame Count (LOFC), Switch Occurrences (SWO), Dura-
tion (DUR), Unavailable Seconds (UAS), Severely Errored
Seconds (SES), and Bursty Errored Seconds (BES). The
value of each of these parameters is displayed for the current
interval for the total of the last 24 hours, and for each valid
interval in the last 24 hours.
ID: HICAP 1234 TxPORT 1559 APS Manager Date: MM/DD/YY
ID: HICAP 5678 LOCAL ACCESS Time: HH:MM:SS
Shelf/Pos: 1.01 Ver. 3.XX
------------------------------ Occurrence History ------------------------------
Net End Near
30 Day Occurrance History
1. 8 11. ----- 21. -----
2. 0 12. ----- 22. -----
3. 0 13. ----- 23. -----
4. 4 14. ----- 24. -----
5. 0 15. ----- 25. -----
6. 1 16. ----- 26. -----
7. 0 17. ----- 27. -----
8. 2 18. ----- 28. -----
9. ----- 19. ----- 29. -----
10. ----- 20. ----- 30. -----
----------------------------------- Messages -----------------------------------
Alarms
Tests
Shelf/Pos:
Figure 4-6 Occurrence History