Verilink 1558D (34-00255) Product Manual - Manual (Page 32)

LAPS Operation 4-6 1558D APS CSU/DSU
The parameters shown on the Performance
Screen are updated in one minute intervals. An
update may be forced by pressing <Ctrl - U> on
the keyboard.
The CSES field is updated once every two sec-
onds. This is done because CSES is a self-
clearing field and CSES events might not be
viewed if the CSES field was updated at a slower
rate.
Maintenance Screen
The Maintenance Screen (Figure 4-7) allows the user to
perform test and maintenance functions on a selected circuit.
Upon entering this screen, the selected circuit will be the
last one chosen on any previous screen. The circuit can be
changed at any time by typing a new circuit shelf/position
number. It makes no difference which field is currently
highlighted as long as the ‘Shelf/Pos:’ prompt is showing
on the bottom display line. The selected circuit can also be
decremented or incremented by pressing <page down> or
<page up> respectively.
Maintenance testing can only be performed on
circuits whose status is not “ACTIVE”. It is rec-
ommended that the user place the circuit in an
“OUT of Service” state to prevent the generation
of alarms during testing. This is done by going to
the Circuit Configuration user interface and
changing the Service Status field from In Service
to Out of Service. After completing maintenance
testing, the unit Service Status should be
changed back to In Service.
The Position, State, Circuit ID, and Status of the currently
selected circuit will be displayed near the top of the Mainte-
nance Screen. The format of this data is the same as that
detailed previously in the Circuit List (page 4 -3).
The highlighted cursor marks the currently selected field
within the Maintenance Screen. Selections within any of the
fields may be changed by pressing <space bar>. A new field
may be selected with the terminal arrow keys or cursor con-
trol commands. A new selection is activated when <enter>
is pressed with the cursor still positioned on that field. The
actions initiated by each field are detailed below:
Clear Tests: Resets any active loopbacks, locked paths (A
or B) and turns off any applied test pattern.
Clear Alarms: Resets alarms at the specified end of the
circuit (Near/Far). The choices are “Near / Far”.
Force: Causes the selected line (A or B) to become the
active line. If the selected line was previously locked, this
command will also serve to unlock it. The choices are: Side
A, Near / Side B, Near / Side A, Far / Side B, Far.
Lock: Causes service to be locked to the selected line. If
the selected line is currently in standBy, the APS will switch
to the selected line before locking. The choices are: Side A,
Near / Side B, Near / Side A, Far / Side B, Far.
Unlock: Unlocks the selected end of the protected span so
that the APS is allowed to use either line. The choices
are: Near / Far.
Target: Allows the user to select which T1 line that the test
is to be applied to. Note that you are not allowed to apply
any test conditions to the “ACTIVE”” T1 line. The choices
are: Side A / Side B.
Loop: Causes the selected loop to be initiated on the line
selected by ‘Target’. The LAPS software does not check the
TxPORT 1559 APS Manager Date: MM/DD/YY
LOCAL ACCESS Time: HH:MM:SS
Ver. 3.XX
--------------------------------- Maintenance ----------------------------------
Pos State Circuit ID Near Far
1.01 In Service HICAP 1234 Active Active
HICAP 5678 Failed StandBy
--------------------------------------- - ---------------------------------------
Clear Tests Target: [Side A]
Clear Alarms: [Near]
Loop: [Near Payload]
Force: [Side A, Near] Unloop: [Far Payload]
Lock: [Side A, Near]
Unlock: [Near] Pattern: [QRSS]
Test Time: [15 Minutes]
Near CRC Errors: 123 Reset Errors
Far CRC Errors: 535
----------------------------------- Messages -----------------------------------
Alarms
Shelf/Pos:
Figure 4-7 Maintenance