Toshiba 3006GAL - Manual (Page 117)

Toshiba Corporation Digital Media Network Company
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10.8.42.6.3.4 Device error count
The device error count field is defined in 10.8.42.6.2.5.
10.8.42.6.3.5 Data structure checksum
The data structure checksum is defined in 10.8.42.6.2.6.
10.8.42.6.4 Self-test log sector
The following Table defines the 512 bytes that make up the SMART self-test log sector.
Self-test log data structure
Byte Descriptions
0-1 Self-test log data structure revision number
2-25 First descriptor entry
26-49 Second descriptor entry
..... ............
482-505 Twenty-first descriptor entry
506-507 Vendor specific
508 Self-test index
509-510 Reserved
511 Data structure checksum
10.8.42.6.4.1 Self-test log data structure revision number
The value of the self-test log data structure revision number is set to 0001h.