Rainbow Electronics T89C51CC01 User Manual
Page 134
134
T89C51CC01
Rev. D – 17-Dec-01
Notes:
1. Operating I
CC
is measured with all output pins disconnected; XTAL1 driven with
T
CLCH
, T
CHCL
= 5 ns (see Figure 61.), V
IL
= V
SS
+ 0.5 V,
V
IH
= V
CC
- 0.5V; XTAL2 N.C.; EA = RST = Port 0 = V
CC
. I
CC
would be slightly higher
if a crystal oscillator used (see Figure 58.).
2. Idle I
CC
is measured with all output pins disconnected; XTAL1 driven with T
CLCH
,
T
CHCL
= 5 ns, V
IL
= V
SS
+ 0.5 V, V
IH
= V
CC
- 0.5 V; XTAL2 N.C; Port 0 = V
CC
; EA = RST
= V
SS
(see Figure 59.).
3. Power Down I
CC
is measured with all output pins disconnected; EA = V
CC
, PORT 0 =
V
CC
; XTAL2 NC.; RST = V
SS
(see Figure 60.). In addition, the WDT must be inactive
and the POF flag must be set.
4. Capacitance loading on Ports 0 and 2 may cause spurious noise pulses to be super-
imposed on the V
OL
s of ALE and Ports 1 and 3. The noise is due to external bus
capacitance discharging into the Port 0 and Port 2 pins when these pins make 1 to 0
transitions during bus operation. In the worst cases (capacitive loading 100pF), the
noise pulse on the ALE line may exceed 0.45V with maxi V
OL
peak 0.6V. A Schmitt
Trigger use is not necessary.
5. Typicals are based on a limited number of samples and are not guaranteed. The val-
ues listed are at room temperature.
6. Under steady state (non-transient) conditions, I
OL
must be externally limited as fol-
lows:
Maximum I
OL
per port pin: 10 mA
Maximum I
OL
per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total I
OL
for all output pins: 71 mA
If I
OL
exceeds the test condition, V
OL
may exceed the related specification. Pins are
not guaranteed to sink current greater than the listed test conditions.
I
TL
Logical 1 to 0 Transition Current,
ports 1, 2, 3 and 4
-650
µ
A
Vin = 2.0 V
C
IO
Capacitance of I/O Buffer
10
pF
Fc = 1 MHz
T
A
= 25
°
C
I
PD
Power Down Current
160
350
µ
A
4.5V < V
CC
<
5.5V
(3)
I
CC
Power Supply Current
I
CCOP
= 0.7 Freq (MHz) + 3 mA
I
CCIDLE
= 0.6 Freq (MHz) + 2 mA
Symbol
Parameter
Min
Typ
(5)
Max
Unit
Test Conditions