Test port input – Atec Agilent-E8364C User Manual

Page 17

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17

E8362/3/4C

Test port input

continued

Description Specification

Supplemental

information

Standard

014

UNL

UNL

and

014

Trace noise magnitude
10 to 45 MHz

1

< 0.050 dB rms

45 to 500 MHz

2

< 0.010 dB rms

1 kHz IF bandwidth

500 MHz to 20 GHz

< 0.006 dB rms

Ratio measurement, nominal

20 to 40 GHz

< 0.006 dB rms

power at test port

40 to 50 GHz

< 0.006 dB rms

Trace noise magnitude – Option 080 enabled

1,

4

10 to 45 MHz

1

< 0.060 dB rms

45 to 500 MHz

2

< 0.010 dB rms

1 kHz IF bandwidth

500 MHz to 20 GHz

< 0.006 dB rms

Ratio measurement, nominal

20 to 40 GHz

< 0.007 dB rms

power at test port

40 to 50 GHz

< 0.008 dB rms

Trace noise phase
10 to 45 MHz

1

< 0.350° rms

45 to 500 MHz

2

< 0.100° rms

1 kHz IF bandwidth

500 MHz to 20 GHz

< 0.060° rms

Ratio measurement, nominal

20 to 40 GHz

< 0.100° rms

power at test port

40 to 50 GHz

< 0.100° rms

Trace noise phase – Option 080 enabled

1,

4

10 to 45 MHz

1

< 0.350° rms

45 to 500 MHz

2

< 0.100° rms

1 kHz IF bandwidth

500 MHz to 20 GHz

< 0.060° rms

Ratio measurement, nominal

20 to 40 GHz

< 0.100° rms

power at test port

40 to 50 GHz

< 0.100° rms

Reference level magnitude
Range

±200 dB

±200 dB

±200 dB

±200 dB

Resolution

0.001 dB

0.001 dB

0.001 dB

0.001 dB

Reference level phase
Range

±500°

±500°

±500°

±500°

Resolution

0.01°

0.01°

0.01°

0.01°

Stability magnitude

3

Typical ratio measurement:

Measured

at

the

test

port

10 to 45 MHz

±0.05 dB/°C

45 MHz to 20 GHz

±0.02 dB/°C

20 to 40 GHz

±0.03 dB/°C

40 to 50 GHz

±0.04 dB/°C

Stability phase

3

Typical ratio measurement:

Measured

at

the

test

port

10 to 45 MHz

±0.5°/°C

45 MHz to 20 GHz

±0.2°/°C

20 to 40 GHz

±0.5°/°C

40 to 50 GHz

±0.8°/°C

Damage input level
Test port 1 and 2

30 dBm or ±40 VDC, typical

R1, R2 in

15 dBm or ±15 VDC, typical

A, B in

15 dBm or ±15 VDC, typical

Coupler thru (Option 014 or UNL and 014)

30 dBm or ±40 VDC, typical

Coupler arm (Option 014 or UNL and 014)

30 dBm or ±7 VDC, typical

Source out (reference)

20 dBm or ±15 VDC, typical

Source out (test ports)

20 dBm or 0 VDC, typical

1. Typical performance.
2. Trace noise magnitude may be degraded to 20 mdB rms at harmonic frequencies

of the first IF (8.33 MHz) below 80 MHz.

3. Stability is defined as a ratio measurement measured at the test port.
4. 0 Hz offset.

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