Operation, Precautions, Connecting the probe to the test instrument – Teledyne LeCroy CP031 User Manual

Page 10: Connecting the probe to the test circuit

Advertising
background image

CP031 Current Probe

4

923362-00 Rev A

Operation

Precautions

The sensor head is a precision assembly consisting of a molded component with a ferrite core and a Hall
effect element. It may be damaged if subjected to sudden changes in temperature, mechanical strain or
shock.

The mating surfaces of the sensor are precision ground and should be treated with care. If there is any
type of dust or dirt on the mating surfaces of the sensor head, measurements may be impaired.

Accurate measurements may not be possible in locations subject to strong magnetic fields such as
transformers and high-current conductors, or in locations subject to strong external electric fields.

Connecting the Probe to the Test Instrument

The CP031 probe has been designed for use with the WaveSurfer, WaveRunner 6000, WavePro 7000,
and WaveMaster series Teledyne Lecroy oscilloscopes equipped with the ProBus interface. Attach the
probe output connector to the oscilloscope input connector. The oscilloscope will recognize the probe,
set the oscilloscope input termination to 1 MΩ and activate the probe control functions in the user
interface. To use the CP031 with a WaveMaster scope, the AP-1M impedance adapter is required.

Connecting the Probe to the Test Circuit

The CP031 has been designed with a movable split core, eliminating the need to break the conductor for
the core to slip around the conductor.

To connect:

1. Pull the slider, so that the clamp opens.

2. Align the sensor so that the current direction indicator corresponds to the direction of current

flow in the conductor.

3. Close the slider on the sensor head until the "UNLOCK’ indication disappears and the "LOCK"

indication appears.

4. Verify that the opening lever is firmly locked and the clamp is securely closed.

NOTE: Never use this probe on bare conductors. The core and shield are grounded and any voltage
applied to the conductor may cause damage the probe or the circuit under test.

Advertising