Metrohm NIRS XDS Process Analyzer – DirectLight/NonContact - Manual (Page 61)

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11
Instrument standardization
11.1 Interactance Reflectance Probe
The tests in this section apply specifically to Interactance Reflectance
Probes.
Do not use the same procedures on other styles of probe. See the
proper section for each style of probe used.
11.1.1 Wavelength Linearization, Interactance Reflectance
The first test to be run is Wavelength Linearization. This provides initial wavelength locations for the
sample spectrum, prior to final wavelength calibration.
Wavelength Linearization uses internal wavelength materials to determine a set of internal, arbitrary
peak positions that the instrument will use to maintain repeatability of wavelength response.
Wavelength Linearization is performed on the internal reference fiber located in the XDS Process
enclosure.
First select the channel. From the menu bar, click
on Acquire, then Select Channel. Use the spinner
to select the correct channel, then click on “OK”.
This must be performed for each channel that is
used. Always verify the channel before proceeding
with the test.
Select “BOTH” at initial setup.
Vision asks for the reference to be placed in the
sample path, for the reflectance probe.