Magnetic (h) field probes, Electric (e) field probes – ETS-Lindgren 7405 E & H Near Field Probe Set User Manual

Page 8

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Introduction

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Magnetic (H) Field Probes

The Model 7405 includes three

H-field probes of varying size and

sensitivity: models 901, 902,

and 903. These probes are highly

selective of the H-field while being

relatively immune to the E-field.

Each H-field probe contains a

single turn, shorted loop inside a

balanced E-field shield. The loops

are constructed by taking a single

piece of 50 ohm, semi-rigid coax

from the connector and turning it

into a loop. When the end of the

coax meets the shaft of the probe,

both the center conductor and the

shield are 360 degrees soldered to

the shield at the shaft.

Then a notch is cut at the high point of the loop. This notch creates a balanced

E-field shield of the coax shield. The loops reject E-field signals due to the

balanced shield.

Electric (E) Field Probes

The Model 7405 includes two E-field probes: the stub probe (model 904) and the

ball probe (model 905). Due to the small sensing element, the stub probe is

relatively insensitive. This is an advantage when the precise location of a

radiating source must be determined. For example, while moving the stub probe

over the pins of an IC chip, variations can be noted at spaces as close as two or

three pins.

By comparison, the ball probe is much more sensitive. The larger sensing

element does not offer the highly-refined definition of the source location which

the stub probe allows, but it is capable of tracing much weaker signals. The

impedance of the stub probe is essentially the same as that of a non-terminated

length of 50 ohm coaxial cable.

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