Rainbow Electronics ATmega64L - Manual (Page 214)

214
ATmega16(L)
2466B–09/01
JTAG Interface and
On-chip Debug
System
Features • JTAG (IEEE std. 1149.1 Compliant) Interface
• Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
• Debugger Access to:
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– Extensive On-chip Debug Support for Break Conditions, Including
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Breakpoints on Single Address or Address Range
– Data Memory Breakpoints on Single Address or Address Range
• Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
• On-chip Debugging Supported by AVR Studio ®
Overview The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, fuses and lock-bits
• On-chip Debugging
A brief description is given in the following sections. Detailed descriptions for Program-
ming via the JTAG interface, and using the Boundary-scan Chain can be found in the
sections “Programming via the JTAG Interface” on page 270 and “IEEE 1149.1 (JTAG)
Boundary-scan” on page 220, respectively. The On-chip Debug support is considered
being private JTAG instructions, and distributed within ATMEL and to selected 3rd party
vendors only.
Figure 112 shows a block diagram of the JTAG interface and the On-chip Debug sys-
tem. The TAP Controller is a state machine controlled by the TCK and TMS signals. The
TAP Controller selects either the JTAG Instruction Register or one of several Data Reg-
isters as the scan chain (shift register) between the TDI – input and TDO – output. The
Instruction Register holds JTAG instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers
used for board-level testing. The JTAG Programming Interface (actually consisting of
several physical and virtual Data Registers) is used for serial programming via the JTAG
interface. The Internal Scan Chain and Break-Point Scan Chain are used for On-chip
Debugging only.
Test Access Port - TAP The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology,
these pins constitute the Test Access Port – TAP. These pins are:
• TMS: Test mode select. This pin is used for navigating through the TAP-controller
state machine.
• TCK: Test clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
Register (Scan Chains).
• TDO: Test Data Out. Serial output data from Instruction register or Data Register.