Diodes AH921 - Manual (Page 8)

Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH AH921
Jul. 2011 Rev. 1. 2 BCD Semiconductor Manufacturing Limited
8
Test Circuit and Test Conditions (Continued)
Figure 8. Test Condition of AH921 (Supply Current)
Note 4: Output initial status is low when powering on.
Note 5: The supply current I
CC
represents the average supply current. The output is open during measurement.
Note 6: The device is put under the magnetic field: B<B
RP.
Figure 9. Test Condition of AH921 (Output Saturation Voltage)
Note 7: The output saturation voltage V
SAT
is measured at V
CC
=3.5V and V
CC
=24V.
Note 8: The device is put under the magnetic field: B>B
OP.