1 test select, Crd5376 – Cirrus Logic CRD5376 User Manual

Page 42

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CRD5376

42

DS612RD2

3.4.1

Test Select

The Test Select control sets the type of analysis to be run on the collected data set.

Control

Description

Time Domain

Runs a min / max calculation on the collected data set and then plots sample data
value vs. sample number.

Histogram

Runs a histogram calculation on the collected data set and then plots sample occur-
rence vs. sample value. Only valid for noise data since sine wave data varys over too
many codes to plot as a histogram.

Signal FFT

Runs an FFT on the collected data set and then plots frequency magnitude vs. fre-
quency. Statistics are calculated using the largest frequency bin as a full-scale signal
reference.

Noise FFT

Runs an FFT on the collected data set and then plots frequency magnitude vs. fre-
quency. Statistics are calculated using a simulated full-scale signal as a full-scale sig-
nal reference.

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