1 jtag data registers (dr), Table 10. boundary scan register, Ds261pp5 – Cirrus Logic CS61584A User Manual

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CS61584A

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DS261PP5

DS261PP5

10.1

JTAG Data Registers (DR)

The test data registers are the Boundary-Scan Reg-
ister (BSR), the Device Identification Register
(DIR), and the Bypass Register (BR).

Boundary Scan Register: The BSR is connected in
parallel to all the digital I/O pins, and provides the
mechanism for applying/reading test patterns
to/from the board traces. The BSR is 62 bits long
and is initialized and read using the instruction
SAMPLE/PRELOAD. The bit ordering for the
BSR is the same as the top-view package pin out,
beginning with the LOS1 pin and moving counter-
clockwise to end with the PD1 pin as shown in Ta-
ble 10. Note that the analog, oscillator, power,
ground, CLKE/IPOL, and MODE pins are not in-
cluded as part of the boundary-scan register.

The input pins require one bit in the BSR and only
one J-TCK cycle is required to load test data for
each input pin.

The output pins have two bits in the BSR to define
output high, output low, or high impedance. The
first bit (shifted in first) selects between an output-
enabled state (bit set to 1) or high-impedance state
(bit set to 0). The second bit shifted in contains the
test data that may be output on the pin. Therefore,
two J-TCK cycles are required to load test data for
each output pin.

The bi-directional pins have three bits in the BSR
to define input, output high, output low, or high im-
pedance. The first bit shifted into the BSR config-
ures the output driver as high-impedance (bit set to
0) or active (bit set to 1). The second bit shifted into
the BSR sets the output value when the first bit is 1.
The third bit captures the value of the pin. This pin
may have its value set externally as an input (if the
first bit is 0) or set internally as an output (if the
first bit is 1). To configure a pad as an input, the J-
TDI pattern is 0X0. To configure a pad as an out-
put, the J-TDI pattern is 1X1. Therefore, three J-
TCK cycles are required to load test data for each
bi-directional pin.

When JTAG testing is conducted in Host mode, the
polarity of the INT pin is determined by the state of
the IPOL pin. The JTAG BSR should configure the
INT pin as an input in Hardware mode and as an
output in Host mode.

Device Identification Register: The DIR provides
the manufacturer, part number, and version of the
CS61584A. This information can be used to verify
that the proper version or revision number has been
used in the system under test. The DIR is 32 bits
long and is partitioned as shown in Table 11. Data
from the DIR is shifted out to J-TDO LSB first.

BSR Bits

Pin Name

Pad Type

0 - 2

LOS1, SAD6

bi-directional

3 - 5

TNEG1, AIS1

bi-directional

6

TPOS1, TDATA1

input

7

TCLK1

input

8 - 9

RNEG1, BPV1

output

10 - 11

RPOS1, RDATA1

output

12 - 13

RCLK1

output

14

ATTEN1, CS

input

15 - 17

RLOOP1, INT

bi-directional

18

RLOOP2, SCLK, RD(DS)

input

19 - 21

LLOOP, SDO, AD0

bi-directional

22 - 24

TAOS1, SDI, AD1

bi-directional

25 - 27

TAOS2, SPOL, AD2

bi-directional

28 - 30

CON01, AD3

bi-directional

31 - 33

CON02, AD4

bi-directional

34 - 36

CON11, AD5

bi-directional

37 - 39

CON12, AD6

bi-directional

40 - 42

CON21, AD7

bi-directional

43

CON22, ALE(AS)

input

44

CON31, WR(R/W)

input

45 - 46

RCLK2

output

47 - 48

RPOS2, RDATA2

output

49 - 50

RNEG2, BPV2

output

51

TCLK2

input

52

TPOS2, TDATA2

input

53 - 55

TNEG2, AIS2

bi-directional

56 - 58

LOS2, SAD7

bi-directional

59

CON32, BTS

input

60

PD2, SAD5

input

61

PD1, SAD4

input

Table 10. Boundary Scan Register

CS61584A

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DS261F1

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