Thermal resistance, Capacitance, Electrical characteristics – Cypress CY7C1380C User Manual

Page 25

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CY7C1380C

CY7C1382C

Document #: 38-05237 Rev. *D

Page 25 of 36

I

SB3

Automatic CE
Power-down
Current—CMOS Inputs

V

DD

= Max, Device Deselected, or

V

IN

≤ 0.3V or V

IN

> V

DDQ

– 0.3V

f = f

MAX

= 1/t

CYC

4.0-ns cycle, 250 MHz

105

mA

4.4-ns cycle, 225 MHz

100

mA

5.0-ns cycle, 200 MHz

95

mA

6.0-ns cycle, 167 MHz

85

mA

7.5-ns cycle, 133 MHz

80

mA

I

SB4

Automatic CE
Power-down
Current—TTL Inputs

V

DD

= Max, Device Deselected,

V

IN

≥ V

IH

or V

IN

≤ V

IL

, f = 0

All speeds

80

mA

Shaded areas contain advance information.

Notes:

12. Overshoot: V

IH

(AC) < V

DD

+1.5V (Pulse width less than t

CYC

/2), undershoot: V

IL

(AC) > -2V (Pulse width less than t

CYC

/2).

13. TPower-up: Assumes a linear ramp from 0v to V

DD

(min.) within 200ms. During this time V

IH

< V

DD

and V

DDQ

< V

DD\

Thermal Resistance

[14]

Parameter

Description

Test Conditions

TQFP

Package

BGA

Package

fBGA

Package

Unit

Θ

JA

Thermal Resistance
(Junction to Ambient)

Test conditions follow standard
test methods and procedures
for measuring thermal
impedence, per EIA / JESD51.

31

45

46

°C/W

Θ

JC

Thermal Resistance
(Junction to Case)

6

7

3

°C/W

Capacitance

[14]

Parameter

Description

Test Conditions

TQFP

Package

BGA

Package

fBGA

Package

Unit

C

IN

Input Capacitance

T

A

= 25

°C, f = 1 MHz,

V

DD

= 3.3V.

V

DDQ

= 2.5V

5

8

9

pF

C

CLK

Clock Input Capacitance

5

8

9

pF

C

I/O

Input/Output Capacitance

5

8

9

pF

Notes:

14. Tested initially and after any design or process change that may affect these parameters

Electrical Characteristics

Over the Operating Range

[12, 13] (continued)

Parameter

Description

Test Conditions

Min.

Max.

Unit

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