Data retention and endurance, Capacitance, Thermal resistance – Cypress CY14B101NA User Manual

Page 8: Ac test conditions

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PRELIMINARY

CY14B101LA, CY14B101NA

Document #: 001-42879 Rev. *B

Page 8 of 25

AC Test Conditions

Input Pulse Levels.................................................... 0V to 3V
Input Rise and Fall Times (10% - 90%)........................ <3 ns
Input and Output Timing Reference Levels.................... 1.5V

Data Retention and Endurance

Parameter

Description

Min

Unit

DATA

R

Data Retention

20

Years

NV

C

Nonvolatile STORE Operations

200

K

Capacitance

Parameter

[14]

Description

Test Conditions

Max

Unit

C

IN

Input Capacitance

T

A

= 25

°C, f = 1 MHz,

V

CC

= 0 to 3.0V

7

pF

C

OUT

Output Capacitance

7

pF

Thermal Resistance

Parameter

[14]

Description

Test Conditions

48-FBGA 48-SSOP 44-TSOP II 32-SOIC

Unit

Θ

JA

Thermal Resistance

(Junction to Ambient)

Test conditions follow standard

test methods and procedures for

measuring thermal impedance,

in accordance with EIA/JESD51.

28.82

TBD

31.11

TBD

°C/W

Θ

JC

Thermal Resistance

(Junction to Case)

7.84

TBD

5.56

TBD

°C/W

Figure 5. AC Test Loads

3.0V

OUTPUT

5 pF

R1

R2

789

Ω

3.0V

OUTPUT

30 pF

R1

R2

789

Ω

for tri-state specs

577

Ω

577

Ω

Note

14. These parameters are guaranteed by design and are not tested.

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