Mds-s50 – Sony MDS-S50 User Manual

Page 18

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18

MDS-S50

4-5.

SELECTING THE TEST MODE

There are 26 types of test modes as shown below. The groups can be switched by turning the

[ AMS ]

knob. After selecting the

group to be used, press the

[YES]

button. After setting a certain group, turning the

[ AMS ]

knob switches modes shown below.

Refer to “Group” in the table for details can be selected.
All items used for servicing can be treated using group [Service]. So be carefully not to enter other groups by mistake.

Note:

Do not use the test mode in the [Develop] group.
If used, the unit may not operate normally.
If the [Develop] group is set accidentally, press the

[MENU/NO]

button immediately to exit the [Develop] group.

• For details of each adjustment mode, refer to “5. Electrical Adjustments”.

For details of “Err Display”, refer to “Self-Diagnosis Function” on page 2.

• If a different mode has been selected by mistake, press the

[MENU/NO]

button to release that mode.

• Modes with (

×

) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set acciden-

tally, press the

[MENU/NO]

button to release the mode immediately.

Display

AUTO CHECK

Err Display

TEMP ADJUST

LDPWR ADJUST

Iop Write

Iop NV Save

EF MO ADJUST

EF CD ADJUST

FBIAS ADJUST

AG Set (MO)

AG Set (CD)

TEMP CHECK

LDPWR CHECK

EF MO CHECK

EF CD CHECK

FBIAS CHECK

ScurveCHECK

VERIFYMODE

DETRK CHECK

0920 CHECK

Iop Read

Iop Compare

ADJ CLEAR

INFORMATION

CPLAY1MODE

CREC 1MODE

Details

Automatic self-diagnosis

Error history display, clear

Temperature compensation offset adjustment

Laser power adjustment

Iop data writing

Writes current Iop value in read nonvolatile memory using microprocessor

Traverse (MO) adjustment

Traverse (CD) adjustment

Focus bias adjustment

Auto gain output level adjustment (MO)

Auto gain output level adjustment (CD)

Temperature compensation offset check

Laser power check

Traverse (MO) check

Traverse (CD) check

Focus bias check

S-curve check

Nonvolatile memory check

Detrack check

Most circumference check

Iop data display

Comparison with initial Iop value written in nonvolatile memory

Initialization of nonvolatile memory for adjustment values

Display of microprocessor version, etc.

Continuous playback mode

Continuous recording mode

No.

C01

C02

C03

C04

C05

C06

C07

C08

C09

C10

C11

C12

C13

C14

C15

C16

C17

C18

C19

C25

C26

C27

C28

C31

C34

C35

Mark

Group

Check

Service

. >

. >

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