Agilent Technologies 8510XF - Manual (Page 7)

Test Sets
The test set in a VNA measurement
system is used to separate the inci-
dent, the reflected, and the transmitted
signals. It is also used to convert
the RF signal to IF (intermediate
fre- quency) signal and to pass the IF
to the receiver.
Once signals are separated, their
individual magnitude and phase
differences can be measured. Test
sets are classified into two groups: (1)
one-path transmission or reflection
and (2) two-path S-parameter allow-
ing forward and reverse measure-
ments of a two port device with a
single connection. S-parameter test
sets can be divided into two types: (1)
sampler- based and (2) mixer-based,
shown in Table 3. Sampler-based test
sets require one external source to
provide the RF stimulus. The mixer-
based test sets require two external
sources; one to provide the RF stimu-
lus and the other to provide the LO
signal.
Table 3. Family of test sets
Products Frequency Test set Recommend Recommend Test port
range (GHz) (application) RF source 1 LO source 1 connector 2
type needed needed (GHz) (GHz)
8511A 3 0.045 to 26.5 Frequency N/A N/A 3.5 mm (M)
Converter
8511B 3 0.045 to 50 Frequency N/A N/A 2.4 mm (F)
Converter
8512A 0.400 to 18 Transmission/ Obsolete
Reflection
8513A 0.045 to 26.5 Transmission/ Obsolete
Reflection
8514A 0.500 to 18 S-parameter Obsolete
8514B 0.045 to 20 S-parameter 83621B ----- 3.5 mm (M)
Sampler-based (0.045 to 20)
8515A 0.045 to 26.5 S-parameter 83631B ----- 3.5 mm (M)
Sampler-based (0.045 to 26.5) -----
8516A 0.045 to 40 S-parameter Obsolete --- replaced with 8517A
8517A 0.045 to 50 S-parameter Obsolete --- replaced with 8517B
8517B 0.045 to 50 S-parameter 83651B ----- 2.4 mm (M)
Sampler-based (0.045 to 50)
85110L 0.045 to 2 Pulsed-RF 83620B 83620B 7 mm
S-parameter #001, 004, #004, 008,
Mixer-based 008, H80 H80
85110A 2 to 20 Pulsed-RF 83622B 83623L 3.5 mm (M)
S-parameter #001, 004, 008 #004, 008
Mixer-based [Option H50:
83650B
(0.045 to 50)
#001, 004, 008]
85105A 4 33 to 110 S-parameter 83621B 83621B WR-22 (33 to 50)
MM-wave (waveguide Mixer-based (0.045 to 20) (0.045 to 20) WR-19 (40 to 60)
Controller bands) (waveguide [Option 050: WR-15 (50 to 75)
bands) 83651B WR-10 (75 to 110)
(0.045 to 50)]
8510XF 0.045 to 110 S-parameter 83651B 83621B 1 mm (M)
MM-wave (coaxial) Mixer-based (0.045 to 50) (0.045 to 20)
Subsystem (ultra-
broadband)
1. Although general purpose 8360 series synthesized sweepers (836x0B) can be used in place of the 8510-dedicated
8360 series synthesized sweepers (836x1B), the following options are typically recommended: Option 004 (rear
panel connectors) and Option 008 (1-Hz frequency resolution). These options are standard in the 8510-dedicated
8360 series synthesized sweepers.
Mixed sources: While mixing synthesized series is acceptable in multiple-source applications, the following areas
must be considered:
• RF source = 8340, LO source = 8340, system performance will be degraded substantially.
• RF source = 8340, LO source = 8360, better system performance
• RF source = 8360, LO source = 8360, faster step frequency measurements. Using the 8340 as either the RF
source or the LO source will more than double the measurement time.
2. All coaxial test port connectors are ruggedized connectors.
3. These test sets provide access to four samplers directly.
4. The following test set modules are available. Two test set modules must be ordered for complete waveguide
S-parameter test set operation for each waveguide band:
• Q85104A test set module (33 GHz to 50 GHz)
• U85104A test set module (40 GHz to 60 GHz)
• V85104A test set module (50 GHz to 75 GHz)
• W85104A test set module (75 GHz to 110 GHz)
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