2 instrument description – JUMO 706585 LOGOSCREEN fd Operating Manual User Manual

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2 Instrument Description

Data security

The data are stored in coded form in a proprietary format. This ensures a high
level of data security. If the CompactFlash card is removed from the
instrument, no data will be lost immediately, as these data are still stored in the
internal memory. A loss of data will only occur if, after the CompactFlash card
has been removed, internal memory is completely rewritten as well, and no
data have been read out through the interface.

If the paperless recorder is disconnected from the supply, then:

• RAM and clock time are buffered by a lithium battery (ex-factory) for at least

 10 years, with a storage capacitor for at least  2 days (ambient
temperature -40 to +45°C),

• Measurement and configuration data in the backup memory will not be lost.

Storage cycle

Different storage cycles, ranging from 125msec to 32000sec can be
configured for normal, event and timed mode under “Configuration”.

The storage cycle determines the time intervals at which the measurements
are stored.

Stored value

Under this parameter, separate configurations are made for normal, event and
timed mode, to decide which value is to be stored (average, momentary,
minimum, maximum, peak values or Eco mode).

Recording
format

Data are recorded encoded in a proprietary format.

Recording
duration

The recording duration depends on various factors:

• number of analog channels and event traces being recorded

• storage cycle (memory rate)

• number of events in the event list

• number of reports running

• number of audit trail entries

• number of electronic signatures

Optimization of
recording
duration

The recording duration can be optimized by process-oriented selection of the
storage cycle and stored value.

In normal operation (no error, no alarm, etc.) a storage cycle that is as long as
possible (e.g. 60sec, 180sec, etc.) should be selected, depending on the
particular application.

In the event of an alarm or error, the storage cycle can be shortened via event
mode, with the effect that the measurement data are recorded with a high time
resolution.

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