Metrohm NIRS XDS MultiVial Analyzer - Manual (Page 60)

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This feature is used only with XDS Process instruments that operate with Transmission Pair probes.
Do not select.
Instrument matching (method transferability) requires that Reference Standardization and
Instrument Calibration be selected, and that Certified Standards are used when required to
maintain calibration. These calibrations should be run when indicated by Photometric Test
(Reference Standardization) and Wavelength Certification (Instrument Calibration).
Some of these selections are spectroscopic
calibrations, and are used to apply corrections to
the instrument to minimize differences between
units of the same configuration.
The correction programs are accessed from the
Diagnostics menu bar, shown at right. The
diagnostic steps are explained in the sections that
follow.
7.1.1 Wavelength Linearization
Wavelength Linearization uses an internal wavelength material set to determine a set of internal,
arbitrary peak positions that the instrument will use to maintain repeatability of wavelength response.
The NIR wavelength positions
of these peaks appear as
shown.
The scale of this display is
marked in encoder pulses,
which do not relate to
nanometers directly.
From the peaks, a linearization
is performed, which allows
assignment of nanometer
values.