Overview, Overview -1 – Altera MAX 10 JTAG User Manual
Page 3
Overview
1
2015.05.04
UG-M10JTAG
MAX
®
10 devices support the IEEE Std.1149.1 (JTAG) boundary-scan testing (BST).
When you perform BST, you can test pin connections without using physical test probes and capture
functional data during normal operation. The boundary-scan cells (BSCs) in a device can force signals
onto pins, or capture data from pin or core logic signals. Forced test data is serially shifted into the BSCs.
Captured data is serially shifted out and externally compared to expected results.
Note: You can perform BST on MAX 10 devices before, after, and during configuration.
Related Information
•
Provides more information about JTAG in-system programming.
•
on page 2-1
•
•
on page 3-1
•
I/O Voltage Support in the JTAG Chain
on page 4-1
•
Enabling and Disabling JTAG BST Circuitry
on page 5-1
•
on page 6-1
•
Boundary-Scan Description Language Support
on page 7-1
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