Metrohm NIRS XDS MasterLab Analyzer - Manual (Page 104)

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8
Instrument Diagnostics, Reflectance
Vision provides diagnostics for instrument setup, which must be performed before use of the
instrument for analysis. Following these diagnostics, another set of diagnostics is provided to
evaluate the ongoing performance of the instrument. These are explained in the sections that follow.
The instrument must be set up with the Iris Adapter for these diagnostics, as small round sample cells
are used. See section 5.6 for instructions on how to install the Iris Adapter.
8.1 Setup Diagnostics, Reflectance
Before use of the XDS Analyzer, some steps
must be performed using Vision Software.
The “Options” for a given Project may be set.
To reach this menu, click on Configure,
Options. The menu shown at right is the
default set of selections. A brief explanation
follows:
Instrument must stabilize before data
acquisition:
This prevents spectral acquisition if the
instrument is cold.
Performance Test must pass before data
acquisition:
This prevents the user from taking data on a
non-functional instrument.
Run performance test after wavelength
linearization:
Forces user to run test sequentially. This is not
necessary with XDS.
Use Auto-Linearization:
Maintains correct wavelength registration automatically, using internal wavelength materials to keep
instrument in precise adjustment over time.
Reference Standardization:
Used to create a virtual 100% reflectance reference, using a traceable photometric standard. This is
explained in the next section. This feature must be used to assure method transferability.
Master Standardization:
This method is not used with XDS. Do not select.
Use Instrument Calibration (XDS only):
This is a method to adjust the instrument wavelength profile to an external, traceable wavelength
standard. This feature must be used to assure method transferability.