Furuno BACK GP-80 - Manual (Page 69)

9-5
9.5 Self Tests
Memory and I/O circuits test
1) Press [MENU ESC] and [8] to display the
SELF TESTS menu.
Figure 9-9 SELF TESTS menu
2) Press [1].
Figure 9-10 MEMORY, I/O PORT
TEST display
3) When testing is finished, press the [MENU
ESC] key to escape and return to the Self
Test menu. (Testing continues if the key
is not pressed.)
OK appears to the right of PROGRAM,
SRAM and Internal Battery when those
devices are normal; NG (No Good) ap-
pears when an abnormality is found.
OK appears to the right of GPS and BEA-
CON when they are normal; NG and 16
hexadecimal figure appear when an ab-
normality is found.
Whenever NG or 16 hexadecimal figure
appears contact your dealer for advice.
DATA 1 PORT, DATA 2 PORT and DATA
4 PORT show results of communication
interface test. A special test connector is
required to test those ports. NG appears
as the results of the self test when there is
no test connector attached.
4) Press the [MENU ESC] key to escape.
Note: The life of the internal battery is approxi-
mately 5 years.
Keyboard test
1) Press [MENU ESC] [8] and [2] to dis-
play the KEYBOARD TEST screen.
Figure 9-11 KEYBOARD TEST screen
2) Press each key one by one. A key's corre-
sponding location on the screen lights in
reverse video if the key is normal.
3) To quit the keyboard test, press the
[CLEAR] key three times. Control is re-
turned to the SELF TESTS menu.
4) Press the [MENU ESC] key.
PROGRAM MEMORY
SRAM
Internal Battery
DATA 1 PORT
DATA 2 PORT
DATA 4 PORT
GPS
BEACON
MEMORY, I/O PORT TEST
MENU:Escape
OK
OK
OK
NG
NG
NG
OK
OK
KEYBOARD TEST
Press CLEAR 3 times to escape
e m a N e p y T . o N e d o C
m u i h t i L 2 T S 2 F - 0 5 4 2 R C L 1 - 0 0 0 1 4 9 - 4 4
1. Memory, I/O Port Test
2. Keyboard Test
3. Test Pattern
4. Automatic Testing
SELF TESTS
2. Keyboard Test
MENU:Escape
:Cursor
GPS PROGRAM No. 4850237002
NAV PROGRAM No. 2051511-xx.xx
BOOT PROGRAM Code B
ENT:Enter
xx.xx: Version no.