IBM THINKCENTER 8189 User Manual

Page 23

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Fixed-Disk

Tests:

v

Seek

Tests

-

checks

the

physical

operation

of

the

drive

head.

Linear

Seek

Random

Seek

Min-Max

Seek

Butterfly

Seek

v

Verify

Tests

-

checks

the

integrity

of

the

data

present

on

the

media.

Linear

Verify

Random

Verify

v

Surface

Scan

Tests

-

checks

the

drive

media

for

defects.

Surface

Scan

(Linear)

Surface

Scan

(Aggressive)

-

this

is

disabled

for

normal

customer

use.

Surface

Scan

(Random)

v

SMART

-

checks

the

SMART

functionality

for

drives

that

support

SMART.

Start

SMART

Self-Test

Get

SMART

test

results

Other

Test

Features:

v

Write-Splice

Repair

-

detects

and

corrects

Error

Correction

Code

errors

during

Verify

tests.

v

Auto

Spin

Down

-

a

gradual

spin

down

of

the

drive

platters

to

avoid

damaging

the

media.

v

Manufacturer

Log

-

an

in-depth

manufacturer

supported

log

of

errors

on

the

drive.

Multitasking:

To

allow

simultaneous

testing

of

multiple

hard

drives

whenever

possible,

the

FDAT

module

is

written

as

a

set

of

multitasking

functions.

Each

drive

under

test

can

run

the

same

test

or

run

a

different

test

at

the

same

time.

Each

subtest

is

written

to

handle

a

single

test

pass

and

all

test

variables

are

kept

track

of

in

a

structure

unique

for

each

drive.

However,

when

testing

IDE

drives,

FDAT

will

not

perform

simultaneous

testing

of

IDE

drives

that

are

attached

to

the

same

IDE

cable.

For

example,

if

FDAT

is

testing

four

IDE

drives

on

a

PC,

it

will

perform

simultaneous

testing

on

drives

1

and

3

first

(master

drives),

then

perform

tests

on

2

and

4

(slave

drives).

FDAT

will

also

perform

simultaneous

testing

on

a

master

and

slave

that

are

on

separate

IDE

cables,

but

will

not

perform

simultaneous

tests

on

a

master

and

slave

on

the

same

IDE

cable.

This

generally

increases

the

amount

of

time

needed

to

test

multiple

IDE

drives.

Another

limitation

of

FDAT’S

multitasking

capability

is

the

use

of

Ultra

DMA

(UDMA).

Only

one

drive

at

a

time

can

access

the

UDMA

channel

and

the

UDMA

channel

buffer

must

be

kept

high

in

order

to

maintain

a

speed

advantage

over

other

data

transfer

modes.

In

order

to

use

the

UDMA

channel

during

testing,

users

must

disable

the

multitasking

feature.

Destructive

vs

non-destructive

testing:

Most

of

the

tests

found

in

FDAT

are

non-destructive.

This

means

that

PCDR

will

preserve

any

data

that

is

present

on

the

tested

media

prior

to

beginning

any

destructive

operations

(i.e.

write

operations).

However,

users

can

run

certain

tests

Chapter

4.

IBM

Enhanced

Diagnostics

17

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