Toshiba MK4006GAH - Manual (Page 116)

Toshiba Corporation Digital Media Network Company
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11.8.42.6.4.3 Self-test index
The self-test index will point to the most recent entry. Initially, when the log is empty, the index will be set
to zero. It will be set to one when the first entry is made, two for the second entry, etc., until the 22nd
entry, when the index will be reset to one.
11.8.42.6.4.4 Data structure checksum
The data structure checksum is the two's complement of the sum of the first 511 bytes in the data
structure. Each byte will be added with unsigned arithmetic, and overflow will be ignored. The sum of all
512 bytes is zero when the checksum is correct. The checksum is placed in byte 511.
11.8.42.6.5 Selective self-test log
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to
select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the
content of the Selective self-test log.
Selective self-test log
Byte Description Read/write
0-1 Data structure revision number R/W
2-9 Starting LBA for test span 1 R/W
10-17 Ending LBA for test span 1 R/W
18-25 Starting LBA for test span 2 R/W
26-33 Ending LBA for test span 2 R/W
34-41 Starting LBA for test span 3 R/W
42-49 Ending LBA for test span 3 R/W
50-57 Starting LBA for test span 4 R/W
58-65 Ending LBA for test span 4 R/W
66-73 Starting LBA for test span 5 R/W
74-81 Ending LBA for test span 5 R/W
82-337 Reserved Reserved
338-491 Vendor specific Vendor specific
492-499 Current LBA under test Read
500-501 Current span under test Read
502-503 Feature flags R/W
504-507 Vendor specific Vendor specific
508-509 Selective self-test pending time R/W
510 Reserved Reserved
511 Data structure checksum R/W
11.8.42.6.5.1 Data structure revision number
The value of the data structure revision number filed shall be 01h. This value shall be written by the host and
returned unmodified by the device.
11.8.42.6.5.2 Test span definition
The Selective self-test log provides for the definition of up to five test spans. The starting LBA for each test span
is the LBA of the first sector tested in the test span and the ending LBA for each test span is the last LBA tested
in the test span. If the starting and ending LBA values for a test span are both zero, a test span is not defined
and not tested. These values shall be written by the host and returned unmodified by the device.