1 introduction to xds™ rapid content analyzer, Introduction to xds™ rapid content analyzer, 1introduction to xds™ rapid content analyzer – Metrohm NIRS XDS RapidContent Analyzer User Manual

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Introduction to XDS™ Rapid Content Analyzer

Thank you for selecting the XDS Rapid Content Analyzer, manufactured by FOSS. This instrument is
the third generation in a series of instruments designed for precision NIR measurement,
characterization of organic materials, and qualification of known materials to allowable quality
parameters.

The XDS Rapid Content Analyzer is designed for stable operation in harsh environments, while
providing the precision and accuracy users have come to expect of Metrohm near-infrared (NIR)
instruments.

The Rapid Content Analyzer uses a proven monochromator design, employing a digitally-controlled
dispersive grating, sensitive detection devices, and state-of-the-art circuitry to enhance signal output
and minimize any extraneous noise that might influence performance. The XDS Rapid Content
Analyzer uses various patented algorithms to provide superior accuracy and transferability between
like instruments. These software algorithms must be used to assure calibration transfer between
instruments. See section 7.1 for full details.

The sampling mechanism is optional on the base Rapid Content Analyzer, and standard with the
Solids Module. This feature offers the benefit of greater sampling area, for a better cross-section of
material.

The sampling cell handles powders, slurries, and coarse materials. The large window is moved along
the sampling port in stages, to cover as much of the sample area as possible. This provides good
sample averaging, to offer better precision.

Horizontal orientation of the sample transport mechanism facilitates loading, and prevents material
spills inside the sampling area of the instrument.

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