Agilent Technologies E4438C - Manual (Page 84)

Performance Tests
Phase Noise and Residual FM (Manual Test - Option UNJ or Option 506 Only)
3-36
Using an Agilent 8662A/8663A high-performance RF signal generator
Figure 3-32 shows the results of the same DUT measured with an Agilent 8662A/8663A high-performance RF
signal generator. In this measurement, the DCFM method was also used to phase lock the DUT to the Agilent
E5500 Series phase noise measurement system. Again, this produces 60 Hz-related spikes as well as other
spurs at 20 and 100 kHz. Notice that the phase noise above 10 kHz is also worse than with the Agilent 8644B
high-performance RF signal generator. The DCFM method of testing phase noise with an Agilent
8662A/8663A high-performance RF signal generator should not be used.
Figure 3-32