Pilz PDP67 F 8DI ION - Manual (Page 25)

Pilz GmbH & Co. KG, Felix-Wankel-Straße 2, 73760 Ostfildern, Germany
Telephone: +49 711 3409-0, Telefax: +49 711 3409-133, E-Mail: [email protected]
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6.3 Wiring examples
6 Wiring
6.3.4 Example: Dual-channel, failsafe input device, with test pulse
Example: Dual-channel, failsafe input device, with test pulse 6- Bsp 4: zweikan fehlersich Sensor getaktet
Features:
 Depending on the application area and its respective regulations, this
connection diagram is suitable in accordance with EN ISO 13849-1
up to PL e
and EN IEC 62061 up to SIL CL 3.
 The input device must be approved for failsafe applications.
 This type of connection is mainly used for signal inputs with infrequent
operation.
 As the test pulses are permanently assigned to the inputs, all short
circuits will be detected, with the exception of short circuits that short
out the input device (cable from the test pulse to the input device and
cable from the input device to the input).
Bsp 4: zweikan fehlersich Sensor getaktet_Zeichnung
Dual-channel input device
with diverse channels
Test pulse T1
Test pulse T0
Test pulse T1
Test pulse T0
Dual-channel input device
with identical channels
Please ensure safety regulations and EMC guidelines are met!