2 gpio - input timing – Texas Instruments TMS320F2802 User Manual

Page 110

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background image

GPIO Signal

1

Sampling Window

Output From

Qualifier

1

1

1

1

1

1

1

1

1

1

1

0

0

0

0

0

0

0

0

0

0

SYSCLKOUT

QUALPRD = 1

(SYSCLKOUT/2)

(SYSCLKOUT cycle * 2 * QUALPRD) * 5

(C)

)

(A)

GPxQSELn = 1,0 (6 samples)

Sampling Period determined
by GPxCTRL[QUALPRD]

(B)

(D)

t

w(SP)

t

w(IQSW)

TMS320F2809, TMS320F2808, TMS320F2806
TMS320F2802, TMS320F2801, TMS320C2802
TMS320C2801, TMS320F28016, TMS320F28015

SPRS230N – OCTOBER 2003 – REVISED MAY 2012

www.ti.com

6.9.2

GPIO - Input Timing

A.

This glitch will be ignored by the input qualifier. The QUALPRD bit field specifies the qualification sampling period. It
can vary from 00 to 0xFF. If QUALPRD = 00, then the sampling period is 1 SYSCLKOUT cycle. For any other value
"n", the qualification sampling period in 2n SYSCLKOUT cycles (that is, at every 2n SYSCLKOUT cycles, the GPIO
pin will be sampled).

B.

The qualification period selected via the GPxCTRL register applies to groups of 8 GPIO pins.

C.

The qualification block can take either three or six samples. The GPxQSELn Register selects which sample mode is
used.

D.

In the example shown, for the qualifier to detect the change, the input should be stable for 10 SYSCLKOUT cycles or
greater. In other words, the inputs should be stable for (5 x QUALPRD x 2) SYSCLKOUT cycles. This would ensure
5 sampling periods for detection to occur. Since external signals are driven asynchronously, an 13-SYSCLKOUT-wide
pulse ensures reliable recognition.

Figure 6-12. Sampling Mode

Table 6-15. General-Purpose Input Timing Requirements

MIN

MAX

UNIT

QUALPRD = 0

1t

c(SCO)

cycles

t

w(SP)

Sampling period

QUALPRD

0

2t

c(SCO)

* QUALPRD

cycles

t

w(IQSW)

Input qualifier sampling window

t

w(SP)

* (n

(1)

– 1)

cycles

Synchronous mode

2t

c(SCO)

cycles

t

w(GPI)

(2)

Pulse duration, GPIO low/high

With input qualifier

t

w(IQSW)

+ t

w(SP)

+ 1t

c(SCO)

cycles

(1)

"n" represents the number of qualification samples as defined by GPxQSELn register.

(2)

For t

w(GPI)

, pulse width is measured from V

IL

to V

IL

for an active low signal and V

IH

to V

IH

for an active high signal.

110

Electrical Specifications

Copyright © 2003–2012, Texas Instruments Incorporated

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