Texas Instruments TMS320F2802 User Manual

Page 116

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TMS320F2809, TMS320F2808, TMS320F2806
TMS320F2802, TMS320F2801, TMS320C2802
TMS320C2801, TMS320F28016, TMS320F28015

SPRS230N – OCTOBER 2003 – REVISED MAY 2012

www.ti.com

Table 6-25

shows the high-resolution PWM switching characteristics.

Table 6-25. High-Resolution PWM Characteristics at SYSCLKOUT = 60–100 MHz

MIN

TYP

MAX

UNIT

Micro Edge Positioning (MEP) step size

(1)

150

310

ps

(1)

Maximum MEP step size is based on worst-case process, maximum temperature and maximum voltage. MEP step size will increase
with low voltage and high temperature and decrease with voltage and cold temperature.
Applications that use the HRPWM feature should use MEP Scale Factor Optimizer (SFO) estimation software functions. See the TI
software libraries for details of using SFO function in end applications. SFO functions help to estimate the number of MEP steps per
SYSCLKOUT period dynamically while the HRPWM is in operation.

Table 6-26

shows the eCAP timing requirement and

Table 6-27

shows the eCAP switching characteristics.

Table 6-26. Enhanced Capture (eCAP) Timing Requirement

(1)

TEST CONDITIONS

MIN

MAX

UNIT

t

w(CAP)

Capture input pulse width

Asynchronous

2t

c(SCO)

cycles

Synchronous

2t

c(SCO)

With input qualifier

1t

c(SCO)

+ t

w(IQSW)

(1)

For an explanation of the input qualifier parameters, see

Table 6-15

.

Table 6-27. eCAP Switching Characteristics

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

t

w(APWM)

Pulse duration, APWMx output high/low

20

ns

Table 6-28

shows the eQEP timing requirement and

Table 6-29

shows the eQEP switching

characteristics.

Table 6-28. Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements

(1)

TEST CONDITIONS

MIN

MAX

UNIT

t

w(QEPP)

QEP input period

Asynchronous

(2)

/synchronous

2t

c(SCO)

cycles

With input qualifier

2[1t

c(SCO)

+ t

w(IQSW)

]

t

w(INDEXH)

QEP Index Input High time

Asynchronous

(2)

/synchronous

2t

c(SCO)

cycles

With input qualifier

2t

c(SCO)

+t

w(IQSW)

t

w(INDEXL)

QEP Index Input Low time

Asynchronous

(2)

/synchronous

2t

c(SCO)

cycles

With input qualifier

2t

c(SCO)

+ t

w(IQSW)

t

w(STROBH)

QEP Strobe High time

Asynchronous

(2)

/synchronous

2t

c(SCO)

cycles

With input qualifier

2t

c(SCO)

+ t

w(IQSW)

t

w(STROBL)

QEP Strobe Input Low time

Asynchronous

(2)

/synchronous

2t

c(SCO)

cycles

With input qualifier

2t

c(SCO)

+t

w(IQSW)

(1)

For an explanation of the input qualifier parameters, see

Table 6-15

.

(2)

Refer to the TMS320F280x, TMS320C280x, and TMS320F2801x DSC Silicon Errata (literature number

SPRZ171

) for limitations in the

asynchronous mode.

Table 6-29. eQEP Switching Characteristics

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

t

d(CNTR)xin

Delay time, external clock to counter increment

4t

c(SCO)

cycles

t

d(PCS-OUT)QEP

Delay time, QEP input edge to position compare sync output

6t

c(SCO)

cycles

116

Electrical Specifications

Copyright © 2003–2012, Texas Instruments Incorporated

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