Pm trip units, Ground fault test, Overcurrent simulation test – GE Industrial Solutions TVRMS2 Digital Test Kit User Manual

Page 24

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TVRMS2 Digital Test Kit
Chapter 5. MicroVersaTrip Plus™ and MicroVersaTrip

PM Trip Units

18

... ..... ..... ..... ..... ..... ..... ..... ..... ..... .

Set Short Time Pickup and press F3

|– CONT –|– EXIT –|

Short Time Pickup setting display.

Select the desired Short Time Pickup setting on the Trip
Unit, then press

CONT

(

F3

), which displays the verification

message:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ...

SHORT TIME TEST WITHOUT BREAKER TRIP

|– CONT –|– EXIT –|

Short Time test verification display.

Press

CONT

(

F3

) to initiate the test or

EXIT

(

F4

) to return

to the function test menu.

Ground Fault Test

If

GF

(

F3

) is selected from the overcurrent test selection

menu, the Test Kit displays the message:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... .....

Set Ground Fault Pickup and press F3

|– CONT –|– EXIT –|

Ground Fault Pickup setting display.

Select the desired Ground Fault Pickup setting on the Trip
Unit, then press

CONT

(

F3

), which displays the verification

message:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..

GND FAULT TEST WITHOUT BREAKER TRIP

|– CONT –|– EXIT –|

Ground Fault test verification display.

Overcurrent Simulation Test

During the simulation for any of the three types of test, the
Test Kit first ramps up the simulation current, starting
from less than .9 times the pickup current and continuing
until pickup is reached. At that point, the display contains
the message:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ....

Input Current = 1.00C IN PICKUP

<Press any key to test at current shown>

Overcurrent simulation pickup display.

The current continues to ramp up until either one of the
function keys is pressed or 15.00C (or 15.00S for Ground
Fault) is reached. In either case, the simulated current is
held constant and a message similar to the following is
displayed:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... .

Current = 15.00C (Press F3 to run test)

|– CONT –|– EXIT –|

Overcurrent test current display.

Pressing

CONT

(

F3

) starts the test and initiates a

countdown timer, which is displayed until the Trip Unit
“trips”:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ...

IN PICKUP: Approx time left = 250 secs

|– <Press any key to abort test> –|

Overcurrent in pickup display.

The simulation can be aborted at any time during the test
by pressing any function key, which displays the following
message:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... .....

–––TEST ABORTED–––

|– MORE –|– EXIT –|

Test aborted display.

When the simulated trip occurs the Test Kit display
contains a message similar to the following:

... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..

Time = 262.64 secs; Current = 1.25C

|– MORE –|– EXIT –|

Trip parameters display.

If a trip test was selected, the Test Kit sends a trip
command to the Trip Unit and activates the (flashing)

BREAKER TRIPPED

LED.

Press

MORE

(

F3

) to return to the trip query display or

EXIT

(

F4

) to return to the function test menu.

CAUTION: When an overcurrent test with breaker trip is
performed, the pickup indicator and the trip targets are
not illuminated on the Trip Unit display, since the
breaker is not actually experiencing an overcurrent
condition. The only indication is that

OVERLOAD

flashes

on TT-type Trip Unit displays, while

FAULT

illuminates

on A-, B-, or C-type Trip Unit displays.

ATTENTION: Quand un test de surcharge avec
déclenchement est effetué, les indicateurs de
déclenchement et pickup ne sont pas allumés sur l’écran
de déclencheur (le disjoncteur n’étant pas reéllement en
condition de surcharge). La seule indication est le
clignotement du segment

OVERLOAD

pour les

déclencheurs de types TT et l’illumination du segment

FAULT

pour les types A, B, ou C.

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