Atec Agilent-1670G - Manual (Page 6)

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Figure 12. Compare Screen
(State Mode Only)
Figure 13. Oscilloscope Display (Option 003)
Figure 14. Pattern Generator Sequence Window (Option 004)
Compare performs a
post-processing, bit-by-bit
comparison of acquired state
data and compare image data.
Copy state acquisition into
compare image buffer (may edit
any bit in compare image). The
compare feature halves the
memory depth (1/4 memory
with Opt. 002)
Stop Measurement halts
repetitive acquisitions when
current and compare acquisitions
are equal or not equal.
Compare Partial allows masking
of a compare image in order to
compare only certain bits or
set ranges of states (rows). (It
compares data that falls within
enabled channels and specified
range.)
Difference Listing highlights
differences between the current
state listing and compare image.
(Reference listing shows
com-pare image and bit masks.)
Several different views of the
oscilloscope display are available,
each offering different control
options. The Scope Channel
display is shown here.
The pattern generator allows the
user to create data streams from
provided macros or from various
external sources and use them to
stimulate a target. Since the pat-
tern generator is internal to the
logic analyzer, the target response
can be measured with the logic
analyzer to identify incorrect
output and potential target
system malfunction.