Agilent Technologies 664xA User Manual
Page 27
Language Dictionary 27
*CLS
Meaning and Type
Clear Status Device Status
Description
This command causes the following actions (see "Chapter 4 - Status Reporting" for descriptions of all registers):
•
Clears the following registers:
•
Standard Event Status.
•
Operation Status Event.
•
Questionable Status Event.
•
Status Byte.
•
Clears the Error Queue.
•
If *CLS immediately follows a program message terminator (<NL>), then the output queue and the MAV bit
are also cleared.
Command Syntax
*CLS
Parameters
(None)
Query Syntax
(None)
*ESE
Meaning and Type
Event Status Enable Device Status
Description
This command programs the Standard Event Status Enable register bits. The programming determines which events of the
Standard Event Status Event register (see *ESR?) are allowed to set the ESB (Event Summary Bit) of the Status Byte
register. A "1" in the bit position enables the corresponding event. All of the enabled events of the Standard Event Status
Event register are logically ORed to cause the Event Summary Bit (ESB) of the Status Byte register to be set. See "Chapter
4 - Status Reporting" for descriptions of all three registers.
Bit Configuration of Standard Event Status Enable Register
Bit Position
7
6
5
4
3
2
1
0
Bit Name
PON
0
CME
EXE
DDE
QYE
0
OPC
Bit Weight
128
64
32
16
8
4
2
1
CME = Command error; DDE = Device-dependent error; EXE = Execution error;
OPC = Operation complete; PON Power-on; QYE = Query error.
Command Syntax
*ESE <NRf>
Parameters
0 to 255
Power On Value
(See *PSC)
Suffix
(None)
Example
*ESE 129
Query Syntax
*ESE?
Returned Parameters
<NR1> (Register value)
Related Commands
*ESR? *PSC *STB?
If PSC is programmed to 0, then the *ESE command causes a write cycle to nonvolatile memory. The
nonvolatile memory has a finite maximum number of write cycles (see Supplemental Characteristics in
Chapter 1 of the power supply Operating Guide). Programs that repeatedly cause write cycles to non-
volatile memory can eventually exceed the maximum number of write cycles and may cause the
memory to fail.