GE Industrial Solutions Entellisys 4.0 System Test Kit User Manual - Manual (Page 30)

System Test Kit 30
Test settings and results are saved to the hard drive with the report name as Test Name_Time.
1.6.1.5 Automatic Trip Time Curve Test
The automated trip curve test is a test that can automatically verify long time, short time,
instantaneous, and ground fault functions based on the settings (ST, LT, IOC, frame size, etc.). The
test kit will inject signals and measure the amount of time delay before the circuit breaker trips.
It would then compare the timing to the circuit breaker trip-time curve to pass or fail each
protection function. Trip time of the circuit breaker will determine the Pass or Fail for the
protection test. It is a No Trip test that will not trip the circuit breaker.
Table 1-7 Test results
Level User-Defined Test Settings are displayed separately for each Level
(Pre-Fault, Fault, and Post-Fault). Use the pull-down menu to select the Level
for the corresponding User-Defined Test Settings.
User-Defined Test Settings Summarizes the test settings injected for the level shown.
Test Results Once the test is performed, it displays the time sequence of circuit breaker
status and the device that actuated the circuit breaker (Shunt Trip or Flux
Shifter).
Expected Trip Time Expected trip time automatically calculated from the pickup, delay band
settings, and circuit breaker clearing time.
Observed Trip Time Observed trip time displayed after the test is performed.
Test Summary LED Specifies the test results by comparing the observed trip time with the
expected trip time.
Green Successful (within +/– 20% of expected time)
Red Unsuccessful
Gray Test Aborted